scholarly article | Q13442814 |
P819 | ADS bibcode | 2014NatCo...5.3991K |
P818 | arXiv ID | 1404.7434 |
P6179 | Dimensions Publication ID | 1053271520 |
P356 | DOI | 10.1038/NCOMMS4991 |
P724 | Internet Archive ID | arxiv-1404.7434 |
P932 | PMC publication ID | 4050261 |
P698 | PubMed publication ID | 24874455 |
P5875 | ResearchGate publication ID | 261988908 |
P50 | author | Jannik C Meyer | Q52675031 |
Jani Kotakoski | Q56046213 | ||
P2093 | author name string | Clemens Mangler | |
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Selective Sputtering and Atomic Resolution Imaging of Atomically Thin Boron Nitride Membranes | Q64031248 | ||
Fabrication of a freestanding boron nitride single layer and its defect assignments | Q84054136 | ||
Direct determination of the chemical bonding of individual impurities in graphene | Q85624796 | ||
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P275 | copyright license | Creative Commons Attribution 3.0 Unported | Q14947546 |
P6216 | copyright status | copyrighted | Q50423863 |
P407 | language of work or name | English | Q1860 |
P921 | main subject | graphene | Q169917 |
P304 | page(s) | 3991 | |
P577 | publication date | 2014-05-29 | |
P1433 | published in | Nature Communications | Q573880 |
P1476 | title | Imaging atomic-level random walk of a point defect in graphene | |
P478 | volume | 5 |
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