| scholarly article | Q13442814 |
| P819 | ADS bibcode | 2017NatCo...815631S |
| P6179 | Dimensions Publication ID | 1085715184 |
| P356 | DOI | 10.1038/NCOMMS15631 |
| P932 | PMC publication ID | 5459997 |
| P698 | PubMed publication ID | 28555629 |
| P50 | author | Scott D. Findlay | Q56558107 |
| Ryo Ishikawa | Q57049685 | ||
| Gabriel Sanchez-Santolino | Q57925805 | ||
| P2093 | author name string | Naoya Shibata | |
| Takao Matsumoto | |||
| Yuichi Ikuhara | |||
| Yuji Kohno | |||
| Takehito Seki | |||
| P2860 | cites work | Visibility of single atoms | Q28242807 |
| Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy | Q30654156 | ||
| Sub-ångstrom resolution using aberration corrected electron optics | Q30841679 | ||
| Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy | Q33545631 | ||
| Towards full-structure determination of bimetallic nanoparticles with an aberration-corrected electron microscope | Q33753867 | ||
| High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy | Q34508345 | ||
| Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction. | Q34767128 | ||
| Quantitative annular dark field electron microscopy using single electron signals | Q35028244 | ||
| On the origin of differential phase contrast at a locally charged and globally charge-compensated domain boundary in a polar-ordered material. | Q35594552 | ||
| Direct observation of Σ7 domain boundary core structure in magnetic skyrmion lattice | Q38547020 | ||
| Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons. | Q40528084 | ||
| Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolution | Q41744977 | ||
| Direct imaging of Pt single atoms adsorbed on TiO2 (110) surfaces. | Q43405658 | ||
| High-resolution detection of Au catalyst atoms in Si nanowires | Q47431932 | ||
| Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts. | Q51080228 | ||
| Adsorption sites of single noble metal atoms on the rutile TiO2 (1 1 0) surface influenced by different surface oxygen vacancies. | Q51403671 | ||
| Dopants adsorbed as single atoms prevent degradation of catalysts. | Q51707602 | ||
| Nonstandard imaging methods in electron microscopy | Q52813855 | ||
| Direct observation of dopant atom diffusion in a bulk semiconductor crystal enhanced by a large size mismatch. | Q53396497 | ||
| New area detector for atomic-resolution scanning transmission electron microscopy. | Q54581838 | ||
| Direct observation of d-orbital holes and Cu–Cu bonding in Cu2O | Q59065077 | ||
| Electron microscopy image enhanced | Q59069041 | ||
| Chemically sensitive structure-imaging with a scanning transmission electron microscope | Q59071030 | ||
| Three-Dimensional Imaging of Individual Dopant Atoms inSrTiO3 | Q59706732 | ||
| Differential phase contrast 2.0—Opening new “fields” for an established technique | Q59903866 | ||
| Modified differential phase contrast Lorentz microscopy for improved imaging of magnetic structures | Q61624021 | ||
| Electron Scattering Factors of Ions and their Parameterization | Q62097813 | ||
| Robust Parameterization of Elastic and Absorptive Electron Atomic Scattering Factors | Q62097826 | ||
| Differential phase-contrast microscopy at atomic resolution | Q62617267 | ||
| Scanning Transmission Electron Microscopy | Q62617293 | ||
| Experimental analysis of charge redistribution due to chemical bonding by high-resolution transmission electron microscopy | Q64031230 | ||
| P275 | copyright license | Creative Commons Attribution 4.0 International | Q20007257 |
| P6216 | copyright status | copyrighted | Q50423863 |
| P407 | language of work or name | English | Q1860 |
| P304 | page(s) | 15631 | |
| P577 | publication date | 2017-05-30 | |
| P1433 | published in | Nature Communications | Q573880 |
| P1476 | title | Electric field imaging of single atoms | |
| P478 | volume | 8 |
| Q64116969 | Atomic electrostatic maps of 1D channels in 2D semiconductors using 4D scanning transmission electron microscopy |
| Q64283758 | Atomic resolution electron microscopy in a magnetic field free environment |
| Q64175668 | Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
| Q58700666 | Direct electric field imaging of graphene defects |
| Q55093282 | Enhancing doping contrast and optimising quantification in the scanning electron microscope by surface treatment and Fermi level pinning. |
| Q97085600 | Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage |
| Q102152124 | In-situ visualization of the space-charge-layer effect on interfacial lithium-ion transport in all-solid-state batteries |
| Q101128224 | Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images |
| Q62616850 | Material structure, properties, and dynamics through scanning transmission electron microscopy. |
| Q57170323 | Progress and prospects of aberration-corrected STEM for functional materials |
| Q47829801 | Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function for differential phase contrast. |
| Q96634947 | Quantitative electric field mapping of a p-n junction by DPC STEM |
| Q57179259 | Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope |
| Q90039566 | Theoretical framework of statistical noise in scanning transmission electron microscopy |
| Q90818107 | Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction |
| Q102049976 | Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio |
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