Transmission electron microscope as an ultimate tool for nanomaterial property studies

scientific article

Transmission electron microscope as an ultimate tool for nanomaterial property studies is …
instance of (P31):
scholarly articleQ13442814

External links are
P356DOI10.1093/JMICRO/DFS078
P698PubMed publication ID23220846
P5875ResearchGate publication ID233878977

P50authorDmitri GolbergQ28497385
Daiming TangQ42883090
Masanori MitomeQ50726260
Yoshio BandoQ55209290
Xianlong WeiQ62608593
Naoyuki KawamotoQ114404745
P2093author name stringXi Wang
P433issue1
P921main subjectmicroscopeQ196538
nanomaterialQ967847
P304page(s)157-175
P577publication date2012-12-07
P1433published inMicroscopyQ27724680
P1476titleTransmission electron microscope as an ultimate tool for nanomaterial property studies
P478volume62

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cites work (P2860)
Q42002733A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer (SMPS-ICPMS).
Q47679747Optical and Optoelectronic Property Analysis of Nanomaterials inside Transmission Electron Microscope.

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