| scholarly article | Q13442814 |
| P356 | DOI | 10.1103/PHYSREVLETT.91.078301 |
| P698 | PubMed publication ID | 12935055 |
| P2093 | author name string | Xiao M | |
| Martin I | |||
| Jiang HW | |||
| P2860 | cites work | A silicon-based nuclear spin quantum computer | Q56156227 |
| Quantum computation with quantum dots | Q56885206 | ||
| Detection of Single Spin Decoherence in a Quantum Dot via Charge Currents | Q57404375 | ||
| Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise | Q58252321 | ||
| Electron-spin-resonance transistors for quantum computing in silicon-germanium heterostructures | Q59434789 | ||
| Indirect interaction of solid-state qubits via two-dimensional electron gas | Q73952593 | ||
| Finite-Temperature Fermi-Edge Singularity in Tunneling Studied Using Random Telegraph Signals | Q74562918 | ||
| A scheme for electrical detection of single-electron spin resonance | Q78898053 | ||
| P433 | issue | 7 | |
| P407 | language of work or name | English | Q1860 |
| P304 | page(s) | 078301 | |
| P577 | publication date | 2003-08-13 | |
| P1433 | published in | Physical Review Letters | Q2018386 |
| P1476 | title | Probing the spin state of a single electron trap by random telegraph signal. | |
| P478 | volume | 91 |
| Q46425159 | Electrical detection of the spin resonance of a single electron in a silicon field-effect transistor |
| Q56030371 | Measuring the temperature of a mesoscopic electron system by means of single electron statistics |
| Q42358378 | Passivation and characterization of charge defects in ambipolar silicon quantum dots |
| Q58112379 | Random telegraph signals by alkanethiol-protected Au nanoparticles in chemically assembled single-electron transistors |
| Q34335272 | Single-shot read-out of an individual electron spin in a quantum dot. |
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