Electronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies

Electronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies is …
instance of (P31):
scholarly articleQ13442814

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P356DOI10.1016/J.MATTOD.2014.05.010

P50authorChiara MusumeciQ57516134
Andrea LiscioQ61083897
Paolo SamorìQ16668804
Vincenzo PalermoQ57016349
P2860cites workNanometer space resolved photochemistryQ61646773
The relationship between nanoscale architecture and function in photovoltaic multichromophoric arrays as visualized by Kelvin probe force microscopyQ56992108
P433issue10
P921main subjectcondensed matter physicsQ214781
P304page(s)504-517
P577publication date2014-12-01
P1433published inMaterials TodayQ6786597
P1476titleElectronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies
P478volume17

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cites work (P2860)
Q36263985Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications
Q34906104Growing perovskite into polymers for easy-processable optoelectronic devices
Q92642821Quantitative imaging of electric surface potentials with single-atom sensitivity

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