In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope

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In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope is …
instance of (P31):
scholarly articleQ13442814

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P356DOI10.1063/1.2186987

P50authorDmitri GolbergQ28497385
Masanori MitomeQ50726260
Yoshio BandoQ55209290
P2093author name stringC. C. Tang
C. Y. Zhi
K. Kurashima
O. Lourie
P433issue12
P921main subjectmicroscopeQ196538
P304page(s)123101
P577publication date2006-03-20
P1433published inApplied Physics LettersQ621615
P1476titleIn situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope
P478volume88

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Q67856542In Situ TEM Electrical Measurementscites workP2860

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