scholarly article | Q13442814 |
P50 | author | Hongzhou Zhang | Q42684619 |
Daniel Fox | Q57042588 | ||
P2093 | author name string | Yanhui Chen | |
Colm C Faulkner | |||
P2860 | cites work | Precision cutting and patterning of graphene with helium ions. | Q33509972 |
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Rapid and precise scanning helium ion microscope milling of solid-state nanopores for biomolecule detection | Q33928674 | ||
Light in tiny holes | Q34597691 | ||
Titanium dioxide surface modification via ion-beam bombardment for vertical alignment of nematic liquid crystal. | Q53472916 | ||
Helium ion microscope: A new tool for nanoscale microscopy and metrology | Q56213020 | ||
Nanopillar growth by focused helium ion-beam-induced deposition | Q58480409 | ||
Measurement of mean free paths for inelastic electron scattering of Si and SiO2 | Q74451743 | ||
In situ lift-out using a FIB-SEM system | Q80247263 | ||
FIB-nanostructured surfaces and investigation of Bio/nonbio interactions at the nanoscale | Q80853438 | ||
Ion beam doping of silicon nanowires | Q81515440 | ||
Etching of graphene devices with a helium ion beam | Q84576270 | ||
Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy | Q84954301 | ||
P921 | main subject | nanotechnology | Q11468 |
P304 | page(s) | 579-585 | |
P577 | publication date | 2012-08-08 | |
P1433 | published in | Beilstein Journal of Nanotechnology | Q814756 |
P1476 | title | Nano-structuring, surface and bulk modification with a focused helium ion beam | |
P478 | volume | 3 |
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