Nano-structuring, surface and bulk modification with a focused helium ion beam

scientific article

Nano-structuring, surface and bulk modification with a focused helium ion beam is …
instance of (P31):
scholarly articleQ13442814

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P356DOI10.3762/BJNANO.3.67
P932PMC publication ID3458604
P698PubMed publication ID23019554
P5875ResearchGate publication ID231225684

P50authorHongzhou ZhangQ42684619
Daniel FoxQ57042588
P2093author name stringYanhui Chen
Colm C Faulkner
P2860cites workPrecision cutting and patterning of graphene with helium ions.Q33509972
Imaging of human colon cancer cells using He-Ion scanning microscopy.Q33758887
Rapid and precise scanning helium ion microscope milling of solid-state nanopores for biomolecule detectionQ33928674
Light in tiny holesQ34597691
Titanium dioxide surface modification via ion-beam bombardment for vertical alignment of nematic liquid crystal.Q53472916
Helium ion microscope: A new tool for nanoscale microscopy and metrologyQ56213020
Nanopillar growth by focused helium ion-beam-induced depositionQ58480409
Measurement of mean free paths for inelastic electron scattering of Si and SiO2Q74451743
In situ lift-out using a FIB-SEM systemQ80247263
FIB-nanostructured surfaces and investigation of Bio/nonbio interactions at the nanoscaleQ80853438
Ion beam doping of silicon nanowiresQ81515440
Etching of graphene devices with a helium ion beamQ84576270
Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopyQ84954301
P921main subjectnanotechnologyQ11468
P304page(s)579-585
P577publication date2012-08-08
P1433published inBeilstein Journal of NanotechnologyQ814756
P1476titleNano-structuring, surface and bulk modification with a focused helium ion beam
P478volume3

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cites work (P2860)
Q38763954A hydrothermally grown CdS nanograin-sensitized 1D Zr:α-Fe2O3/FTO photoanode for efficient solar-light-driven photoelectrochemical performance
Q47139260Chemical Changes in Layered Ferroelectric Semiconductors Induced by Helium Ion Beam.
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Q43154117Focused particle beam-induced processing
Q90438856Focused-helium-ion-beam blow forming of nanostructures: radiation damage and nanofabrication
Q57563385Helium ion microscopy
Q34863884Helium ion microscopy of graphene: beam damage, image quality and edge contrast.
Q59620213Local modification of magnetic anisotropy and ion milling of Co/Pt multilayers using a He+ion beam microscope
Q58901961Nanopatterning and Electrical Tuning of MoS2 Layers with a Subnanometer Helium Ion Beam
Q50136242Rapid and localized ion-beam etching of surfaces using initial notches
Q94566411Special Issue: Radiation Damage in Materials-Helium Effects
Q46569743Sub-5 nm graphene nanopore fabrication by nitrogen ion etching induced by a low-energy electron beam