In situ lift-out using a FIB-SEM system

scientific article published on 01 January 2004

In situ lift-out using a FIB-SEM system is …
instance of (P31):
scholarly articleQ13442814

External links are
P356DOI10.1016/J.MICRON.2004.03.002
P698PubMed publication ID15219907

P2093author name stringLangford RM
Clinton C
P433issue7
P304page(s)607-611
P577publication date2004-01-01
P1433published inMicronQ6839708
P1476titleIn situ lift-out using a FIB-SEM system
P478volume35

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cites work (P2860)
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Q34205028Improved focused ion beam target preparation of (S)TEM specimen--a method for obtaining ultrathin lamellae.
Q34423632Nano-structuring, surface and bulk modification with a focused helium ion beam
Q52585395Novel in-situ lamella fabrication technique for in-situ TEM.
Q85647629Quantitative EDXS analysis of organic materials using the ζ-factor method
Q35747228Quantitative analysis of magnetic spin and orbital moments from an oxidized iron (1 1 0) surface using electron magnetic circular dichroism

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