| P50 | author | Emad Oveisi | Q57024640 |
| | Duncan T.L. Alexander | Q60632777 |
| | Pascal Vitali Fua | Q29455388 |
| P2093 | author name string | Cécile Hébert | |
| | Guillaume Lucas | |
| | Robin Schäublin | |
| | Quentin Jeangros | |
| | Antoine Letouzey | |
| P2860 | cites work | Diffraction contrast STEM of dislocations: imaging and simulations | Q84963434 |
| | An Experimental Protocol Development of Three-Dimensional Transmission Electron Microscopy Methods for Ferrous Alloys: Towards Quantitative Microstructural Characterization in Three Dimensions | Q105727201 |
| | Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy. | Q51154302 |
| | Impact of misfit dislocations on the polarization instability of epitaxial nanostructured ferroelectric perovskites. | Q51721345 |
| | The Mechanism of Plastic Deformation of Crystals. Part I. Theoretical | Q56431622 |
| | Zur Kristallplastizit�t. III | Q56502986 |
| | Nanoscale analysis of three-dimensional structures by electron tomography | Q57389127 |
| | Dislocations and the Theory of Solids | Q59073825 |
| | Electron tomography | Q60035314 |
| | Ultrathin InAlN/GaN heterostructures on sapphire for high on/off current ratio high electron mobility transistors | Q61935475 |
| | High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopy | Q62559038 |
| | Dislocation electron tomography and precession electron diffraction – minimising the effects of dynamical interactions in real and reciprocal space | Q62559039 |
| | Obstacles and optimisation in weak-beam dark-field tomography of defects | Q62559040 |
| | On the origin of threading dislocations in GaN films | Q62559042 |
| | Three-dimensional analysis of dislocation networks in GaN using weak-beam dark-field electron tomography | Q62559056 |
| | Growth and characterisation of GaN with reduced dislocation density | Q62559060 |
| | Three-dimensional imaging of individual hafnium atoms inside a semiconductor device | Q62617360 |
| | Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems | Q81117758 |
| | Observations on the behavior of vitreous ice at approximately 82 and approximately 12 K | Q82359867 |
| | Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM | Q83227306 |
| | Three-dimensional imaging in aberration-corrected electron microscopes | Q84448919 |
| | Three-dimensional imaging of dislocation propagation during crystal growth and dissolution | Q27314714 |
| | Electron tomography and holography in materials science | Q28239048 |
| | Three-dimensional imaging of nanovoids in copper interconnects using incoherent bright field tomography | Q29999325 |
| | Depth sectioning with the aberration-corrected scanning transmission electron microscope | Q30477033 |
| | Stereoscopy techniques for the electron microscope | Q30690756 |
| | The formation and interpretation of defect images from crystalline materials in a scanning transmission electron microscope | Q30690818 |
| | Development of a real-time stereo transmission electron microscope | Q30789293 |
| | High-resolution three-dimensional imaging of dislocations. | Q33251277 |
| | Reducing the missing wedge: High-resolution dual axis tomography of inorganic materials. | Q33252975 |
| | Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope. | Q33494266 |
| | Advanced scanning transmission stereo electron microscopy of structural and functional engineering materials. | Q34415374 |
| | Reconstruction of three dimensional structures from electron micrographs | Q34682297 |
| | Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning | Q35652139 |
| | Retrospective: radiation damage and its associated "information limitations". | Q37202982 |
| | Stereoscopy by tilted illumination in transmission electron microscopy | Q46237254 |
| | High-resolution detection of Au catalyst atoms in Si nanowires | Q47431932 |
| P275 | copyright license | Creative Commons Attribution 4.0 International | Q20007257 |
| P6216 | copyright status | copyrighted | Q50423863 |
| P433 | issue | 1 | |
| P407 | language of work or name | English | Q1860 |
| P304 | page(s) | 10630 | |
| P577 | publication date | 2017-09-06 | |
| P1433 | published in | Scientific Reports | Q2261792 |
| P1476 | title | Tilt-less 3-D electron imaging and reconstruction of complex curvilinear structures | |
| P478 | volume | 7 | |